A technique for encasing specimens in a thin gas layer during their observation in the Siemens Elmiskop I is described. All gases can be employed at pressures up to one atmosphere. Destruction of specimens can occur in the beam; all organic specimens are particularly liable to decompose. The conditions under which this can be avoided are given. A useful application of the technique allows one to prevent specimens from drying out, as they normally do in vacuum. A further application uses the controlled removal of carbon for thinning organic layers and for selective etching of organic materials.
Article| April 01 1962
ELECTRON MICROSCOPIC OBSERVATION OF SPECIMENS UNDER CONTROLLED GAS PRESSURE
Hans Gunther Heide
From the Institut für Elektronenmikroskopie am Fritz-Haber-Institut der Max-Planck-Gesellschaft, Berlin-Dahlem, Germany
Online Issn: 1540-8140
Print Issn: 0021-9525
Copyright © 1962 by The Rockefeller Institute Press
J Cell Biol (1962) 13 (1): 147–152.
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Hans Gunther Heide; ELECTRON MICROSCOPIC OBSERVATION OF SPECIMENS UNDER CONTROLLED GAS PRESSURE . J Cell Biol 1 April 1962; 13 (1): 147–152. doi: https://doi.org/10.1083/jcb.13.1.147
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