Figure 2.
Figure 2. Characterizing up and down events. (A and C) Scatter plots of displacements (Δx measured as shown in Fig. 1, G and H) in the up (A) and down (C) events versus corresponding preswitch forces. (B and D) Histograms and their Gaussian fits of the data from A and C. Means ± SD from histograms are shown in A and C as solid and dashed lines. (E) Means ± SEM of up or down displacements measured from experiments using the indicated cells expressing αLβ2. (F) Occurrence frequencies of up or down events under indicated cation conditions using ICAM-1 or indicated mAbs. Frequencies measured using ICAM-1 with KIM185 mAb or XVA143 in solution are also shown. Error bars are SEM computed from binomial distributions based on the means and numbers of measurements (70–300). N.D., not detected.

Characterizing up and down events. (A and C) Scatter plots of displacements (Δx measured as shown in Fig. 1, G and H) in the up (A) and down (C) events versus corresponding preswitch forces. (B and D) Histograms and their Gaussian fits of the data from A and C. Means ± SD from histograms are shown in A and C as solid and dashed lines. (E) Means ± SEM of up or down displacements measured from experiments using the indicated cells expressing αLβ2. (F) Occurrence frequencies of up or down events under indicated cation conditions using ICAM-1 or indicated mAbs. Frequencies measured using ICAM-1 with KIM185 mAb or XVA143 in solution are also shown. Error bars are SEM computed from binomial distributions based on the means and numbers of measurements (70–300). N.D., not detected.

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