Figure 19.

Modeled Ig of WT hERG1 channels in the presence of extracellular Cd2+. (A) Ig in response to the voltage-clamping protocol used in Fig. 12. (B and C) IgON at 0–10 ms and 10–300 ms, respectively. (D and E) IgOFF at 300–310 ms and 310–600 ms, respectively. (F) Gating current (Ig) caused by movement of VSD and current conducted by Cd2+ (ICd) for a 300-ms voltage step to +60 mV, followed by a return to the holding potential of −110 mV. The sum of these two currents produces the gating currents simulated to occur in the presence of Cd2+. (G) Currents underlying the initial 2 ms of IgOFF (300–302 ms). Major contributors to initial IgOFF are Cd2+currents (ICd) related to transitions between S19–S25 and S24–S30 (black) and between S5–S15 and S14–S24 (pink). Currents related to VSD movement (red, green, and blue) have a small contribution to initial IgOFF but dominate after decay of ICd.

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