Figure 4.
Comparisons of different objectives in bead size measurements using 3D-Speckler. (A) Representative images and lateral (L) and axial (A) FWHM size measurements of 500-nm beads (n > 100) using objectives of different magnifications (Mag) and NA. (B) Representative images and lateral (L) and axial (A) FWHM size measurements of 100-nm beads (n > 100) using objectives of different Mag and NA. (C) Representative image and lateral (L) and axial (A) FWHM size measurements of 200-nm beads (n > 100). (D) Representative images and lateral (L) and axial (A) FWHM size measurements of 500-nm beads by wide-field and confocal microscopes. (E) Representative deconvolved images and lateral (L) FWHM/gFWHM size measurements of 500-nm beads using images in A (n > 100). Values are mean ± SD.

Comparisons of different objectives in bead size measurements using 3D-Speckler. (A) Representative images and lateral (L) and axial (A) FWHM size measurements of 500-nm beads (n > 100) using objectives of different magnifications (Mag) and NA. (B) Representative images and lateral (L) and axial (A) FWHM size measurements of 100-nm beads (n > 100) using objectives of different Mag and NA. (C) Representative image and lateral (L) and axial (A) FWHM size measurements of 200-nm beads (n > 100). (D) Representative images and lateral (L) and axial (A) FWHM size measurements of 500-nm beads by wide-field and confocal microscopes. (E) Representative deconvolved images and lateral (L) FWHM/gFWHM size measurements of 500-nm beads using images in A (n > 100). Values are mean ± SD.

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