Table I.

Super-resolution light microscopy methods

 Near-field Far-field 
Principle Small aperture scanning (no lens) Evanescent wave illumination Wide-field + deconvolution Confocal laser scanning Moiré effect with structured illumination PSF shaping with saturated emission depletion Photoswitching and localization of single molecules (pointillism) 
Acronym SNOM/NSOM TIRFM  CLSM SIM (HELM, PEM) 3D-SIM SSIM (SPEM) STED/CW-STED PALM/FPALM/STORM/dSTORM/PALMIRA 
Illumination-emission dependence Linear Linear Linear Linear Linear Non-linear Non-linear Linear 
Detector Scanning PMT/APD Wide-field CCD/CMOS Wide-field CCD/CMOS Scanning PMT/APD Wide-field CCD/CMOS Wide-field CCD/CMOS Scanning PMT/APD Wide-field CCD/CMOS 
XY-resolution 20–120 nm 200–300 nm 180–250 nm 180–250 nm 100–130 nm 50 nm 20–100 nm 20–50 nm 
Z-resolution 10 nm (near-field range) 100 nm (near-field range) 500–700 nm 500–700 nm 250–350 nm N.D. 560 nm (CW-STED) to 700 nm (100 nm with z-phase mask) 100 nm (TIRF) 20–30 nm (3D-STORM, TIRF) 75 nm (BP-FPALM, in plane) 
Serial z-sectioning No No Yes Yes Yes Yes Yes Yes 
Z stack range N.A. N.A. 100 µm 100 µm 10–20 µm N.A. >20 µm 100 nm – few µm (BP-FPALM) 
Dyes Any Any Any Any Most conventional dyes (photostable) Dyes require special characteristics Dyes require special characteristics (CW-STED works with many conventional dyes) Dyes require special characteristics 
Simultaneous colors >3 >3 
Temporal resolution for 512 × 512 image s-min ms ms ms-s ms-s s-min ms-min s-min 
Energy load/intensity Low Low Low Medium Medium High Medium-high Medium-high 
Live-cell imaging Yes Yes Yes Yes Restricted (2D-TIRF) No Restricted Restricted 
Postprocessing required No No Yes No Yes 9–25 raw images per slice Yes z100 raw images per slice No Yes >1,000 raw images per slice 
Notes No intracellular imaging Restricted to region near the coverslip Risk of artifacts; better for sparse samples  Reconstruction bears risk of artefacts High excitation required; reconstruction bears risk of artefacts Complex instrumentation; photobleaching May require TIRF setup for best performance; labeling density is critical; performs better on particles and filaments as on volume stains 
Dual lens implementation   I5M 4Pi I5S  4 Pi-STED/iso-STED iPALM 
Z-resolution   70 nm 80 nm 100 nm  20–100 nm 10 nm (depth ∼200 nm) 
 Near-field Far-field 
Principle Small aperture scanning (no lens) Evanescent wave illumination Wide-field + deconvolution Confocal laser scanning Moiré effect with structured illumination PSF shaping with saturated emission depletion Photoswitching and localization of single molecules (pointillism) 
Acronym SNOM/NSOM TIRFM  CLSM SIM (HELM, PEM) 3D-SIM SSIM (SPEM) STED/CW-STED PALM/FPALM/STORM/dSTORM/PALMIRA 
Illumination-emission dependence Linear Linear Linear Linear Linear Non-linear Non-linear Linear 
Detector Scanning PMT/APD Wide-field CCD/CMOS Wide-field CCD/CMOS Scanning PMT/APD Wide-field CCD/CMOS Wide-field CCD/CMOS Scanning PMT/APD Wide-field CCD/CMOS 
XY-resolution 20–120 nm 200–300 nm 180–250 nm 180–250 nm 100–130 nm 50 nm 20–100 nm 20–50 nm 
Z-resolution 10 nm (near-field range) 100 nm (near-field range) 500–700 nm 500–700 nm 250–350 nm N.D. 560 nm (CW-STED) to 700 nm (100 nm with z-phase mask) 100 nm (TIRF) 20–30 nm (3D-STORM, TIRF) 75 nm (BP-FPALM, in plane) 
Serial z-sectioning No No Yes Yes Yes Yes Yes Yes 
Z stack range N.A. N.A. 100 µm 100 µm 10–20 µm N.A. >20 µm 100 nm – few µm (BP-FPALM) 
Dyes Any Any Any Any Most conventional dyes (photostable) Dyes require special characteristics Dyes require special characteristics (CW-STED works with many conventional dyes) Dyes require special characteristics 
Simultaneous colors >3 >3 
Temporal resolution for 512 × 512 image s-min ms ms ms-s ms-s s-min ms-min s-min 
Energy load/intensity Low Low Low Medium Medium High Medium-high Medium-high 
Live-cell imaging Yes Yes Yes Yes Restricted (2D-TIRF) No Restricted Restricted 
Postprocessing required No No Yes No Yes 9–25 raw images per slice Yes z100 raw images per slice No Yes >1,000 raw images per slice 
Notes No intracellular imaging Restricted to region near the coverslip Risk of artifacts; better for sparse samples  Reconstruction bears risk of artefacts High excitation required; reconstruction bears risk of artefacts Complex instrumentation; photobleaching May require TIRF setup for best performance; labeling density is critical; performs better on particles and filaments as on volume stains 
Dual lens implementation   I5M 4Pi I5S  4 Pi-STED/iso-STED iPALM 
Z-resolution   70 nm 80 nm 100 nm  20–100 nm 10 nm (depth ∼200 nm) 

N.A., not applicable; N.D., not described.

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