Table 1.
ISI and alternative techniques compared
CharacteristicROIFSMISI
Contrast 
Signal level − 
Preimaging − 
Optical damage free − − 
3D − 
Aberration immunity − 
Sample availability − 
Deterministic − − 
Pattern persistence − − 
Turnover assessment − 
CharacteristicROIFSMISI
Contrast 
Signal level − 
Preimaging − 
Optical damage free − − 
3D − 
Aberration immunity − 
Sample availability − 
Deterministic − − 
Pattern persistence − − 
Turnover assessment − 

Notes: (a) In FSM, Contrast and Signal level are negatively coupled. (b) ROI switch may achieve 3D patterning by using coherent light processing (e.g., spatial phase modulation). (c) FSM and ISI are only immune to aberrations in the process of writing speckles, not in imaging. (d) Pattern persistence and Turnover assessment are essentialy mutually exclusive, meaning that a given technique is positive/negative for one of the parameters. FSM Turnover assessment is still possible through measurement of speckle lifespan, which requires single speckle birth detection, tracking, and death detection.

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