One measure of the voltage dependence of ion channel conductance is the amount of gating charge that moves during activation and vice versa. The limiting slope method, introduced by Almers (Almers, W. 1978. Rev. Physiol. Biochem. Pharmacol. 82:96–190), exploits the relationship of charge movement and voltage sensitivity, yielding a lower limit to the range of single channel gating charge displacement. In practice, the technique is plagued by low experimental resolution due to the requirement that the logarithmic voltage sensitivity of activation be measured at very low probabilities of opening. In addition, the linear sequential models to which the original theory was restricted needed to be expanded to accommodate the complexity of mechanisms available for the activation of channels. In this communication, we refine the theory by developing a relationship between the mean activation charge displacement (a measure of the voltage sensitivity of activation) and the gating charge displacement (the integral of gating current). We demonstrate that recording the equilibrium gating charge displacement as an adjunct to the limiting slope technique greatly improves accuracy under conditions where the plots of mean activation charge displacement and gross gating charge displacement versus voltage can be superimposed. We explore this relationship for a wide variety of channel models, which include those having a continuous density of states, nonsequential activation pathways, and subconductance states. We introduce new criteria for the appropriate use of the limiting slope procedure and provide a practical example of the theory applied to low resolution simulation data.
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1 January 1997
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January 01 1997
Total Charge Movement per Channel : The Relation between Gating Charge Displacement and the Voltage Sensitivity of Activation
Daniel Sigg,
Daniel Sigg
From the Department of Physiology and Department of Anesthesiology, School of Medicine, University of California, Los Angeles, Los Angeles, California 90095
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Francisco Bezanilla
Francisco Bezanilla
From the Department of Physiology and Department of Anesthesiology, School of Medicine, University of California, Los Angeles, Los Angeles, California 90095
Search for other works by this author on:
Daniel Sigg
,
Francisco Bezanilla
From the Department of Physiology and Department of Anesthesiology, School of Medicine, University of California, Los Angeles, Los Angeles, California 90095
Address correspondence to Dr. F. Bezanilla or D. Sigg, Department of Physiology, UCLA School of Medicine, Los Angeles, CA 90095. FAX: 310-794-9612; E-mail: [email protected]
Received:
June 21 1996
Accepted:
September 16 1996
Online ISSN: 1540-7748
Print ISSN: 0022-1295
1997
J Gen Physiol (1997) 109 (1): 27–39.
Article history
Received:
June 21 1996
Accepted:
September 16 1996
Citation
Daniel Sigg, Francisco Bezanilla; Total Charge Movement per Channel : The Relation between Gating Charge Displacement and the Voltage Sensitivity of Activation. J Gen Physiol 1 January 1997; 109 (1): 27–39. doi: https://doi.org/10.1085/jgp.109.1.27
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